Facilities

Center members and visitors interested in formulating projects that require the usage of laboratory facilities listed below are advised to contact the corresponding faculty-in-charge to discuss projects of mutual interest.

The Reliability Testing Laboratory (Faculty-in-Charge: Prof. Elyse Rosenbaum) is a facility for wafer-level device characterization and stressing. Laboratory equipment includes a Transmission Line Pulse Tester (TLP), a Very Fast Transmission Line Pulse Tester (VFTLP), HP 4156 and 4145 Semiconductor Parameter Analyzers, HP 4140B picoAmmeter,  LCR meter, network analyzer, Spectrum analyzer, and noise figure meter.

The VLSI Information Processing Systems (ViPS) Laboratory (Faculty-in-Charge: Prof. Naresh Shanbhag) has facilities for testing of digital integrated circuits. The ViPS lab equipment includes: logic analyzers (HP16500C and TLA720), pattern generators (HP16522A and DG2020A), digital oscilloscope (HP16534A), state-timing modules (HP16556D and TLA7N2), pulse generator (HP8110A), output modules (HP81103), PLL modules (HP81106A), probes, etc.

The Center has UltraSparc Sun Workstations and powerful servers with IC design software from Cadence, Synopsys, Avant!, and Mentor. Office space in close proximity to faculty and graduate students is  available for Center visitors.