Seminars

These seminars are intended to bring out current issues in microsystem design. Speakers from industry as well as academia are invited as speakers.
 

Spring 2000:

Name	Affiliation	Date	Title
Prof. Naresh R. Shanbhag	iCIMS	24 Jan.	The Illinois Center for Integrated Microsystems (iCIMS)
Prof. Sachin Sapatnekar	U. of Minnesota	31 Jan	Synthesis and Optimization of Domino Logic
Jonathan Ashbrook	iCIMS	7 Feb	Building a Hermitian Decoder
Kwang-Hyun Baek, Seung-Ook Jung, Chulwoo Kim, Seung-Moon Yoo	iCIMS	14 Feb	New Current-Mode Sense Amplifiers for High Density DRAM and PIM Architectures with Copper Interconnects
Geng Bai	iCIMS	21 Feb	Digital VLSI Power Bus Reliability Constraints Estimation
Murat Becer	iCIMS	21 Feb	An Analytical Model for Delay and Crosstalk Estimation with Application to Decoupling
Patrick Juliano	iCIMS	28 Feb	Electrostatic Discharge and High Current Pulse Characterization of Commercial SiGe HBTs
Sanjay J. Patel	CRHC	6 Mar	The rePLay Framework and Other New Concepts in High-Performance Processor Design
Jie Wu	iCIMS	20 Mar	Anode Hole Injection Versus Hydrogen Release: The Mechanism for Gate Oxide Breakdown
Tony Bonaccio	IBM	21 Mar	Signal Processing and Analog Circuits for Hard Disk Drive Electronics
Ganesh Balamurugan	iCIMS	27 Mar	Noise-Tolerant Dynamic Circuit Design
Prof. Dilip V. Sarwate	Communications	3 Apr	High-Speed Architectures for Reed-Solomon Decoders
Emanuel Popovici	Romania	10 Apr	FPGA Implementation of an Encoder/Decoder for Hermitian Codes
Prof. Christoforos Hadjicostis	Decision & Control	17 Apr	Fault-Tolerant Linear Filters and Finite State Machines
Joseph Kozhaya	iCIMS	24 Apr	Fast Power Grid Simulation
Mark Bohr	Intel	1 May	Directions and Challenges in Integrated Circuit Scaling

Fall 2000:

Name	Affiliation	Date	Title
Martin Wong	Univ of Texas	11 Aug	Efficient and Exact Solutions for Interconnect Optimization
Makram Mansour	iCIMS	11 Sep	Simplified Current & Delay Models for Deep Submicron CMOS Digital Circuits
Amr Haggag	Beckman Institute	18 Sep	Modern Approaches to Reliability Assurance for Future High-Performance Chips: Probabilistic-Physics-of-Failure/Short-Time-Test Models
Prof. Andreas Veneris	Univ. of Toronto	25 Sep	Design Optimization Based on Diagnosis Techniques
Prof. Amit Mehrotra	iCIMS	31 Oct	Multiple Si Layer ICs: Motivation, Performance Analysis, and Design Implications
Prof. K. Thulasiraman	Univ of Oklahoma	4 Dec	Heuristics and Approximation Schemes for QoS Routing and Performance Studies
Steven Voldman	IBM	13 Dec	Silicon Germanium Technology and Electrostatic Discharge Phenomena

Fall 2001:

Name	Affiliation	Date	Title
Vesselin Vassilev	IMEC	6 Sep	Analysis and improved compact modeling of the breakdown behavior of sub-0.25 micron ESD protection grounded-gate NMOS (ggNMOS) devices
Bart Keppens	IMEC	6 Sep	Contributions to standardization of transmission line pulse testing methodology
Michael Orshansky	Berkeley	18 Sep	Statistical Modeling for Computer-Aided Design for Manufacturing

Spring 2002:

Name	Affiliation	Date	Title
Kaushik Roy	Purdue	20 Feb	Deep Sub-Micron Leakage: Trends and Possible Solutions
Ankur Srivastava	UCLA	2 Apr	Predictability Driven Binding
Sarita Adve	CS	23 Apr	Energy-Driven Hardware Adaptions for Multimedia Applications on General-Purpose Processors
Kevin Cao	Berkeley	24 Apr	Impact of Nano-CMOS Technology on Multi-GHz
Donhee Ham	CA Inst of Tech	1 May	Noise Processes in Integrated Communication Systems “Statistical Electronics”
Robert Dick	Princeton	6 May	Embedded System-on-Chip Design Automation
Rob A. Rutenbar	Carnegie Mellon Univ	9 May	Synthesis for Industrial-Scale Analog Intellectual Property
Pascal Salome and Stephanie Dournelle	ST Microelectronics	11 Jun	How to Protect Integrated Circuits Against Charged Device Model (CDM) ESD Stress

Fall 2002:

Name	Affiliation	Date	Title
Tim Mahoney	Intel	26 Sep	Some New Developments in ESD Protection and I/O Design

Spring 2003:

Name	Affiliation	Date	Title
Sandip Kundu	Intel	17 Feb	Analysis of Power Supply Grid of Microprocessors
Paul Hurst	UCDavis	27 Mar	Mixed-Signal Circuits for Digital Communication and Data Conversion
Steve Kang	UCSC	4 Apr	Optimal Design of CMOS Circuits Tolerant of Leakage Currents
Robert Gauthier	IBM	14 Apr	Electrostatic Discharge Protection: Background of Today's CMOS Protection Concepts and the Challenges We Face Moving Forward in the Future
Michael Stockinger	Motorola	24 Apr	Modular, Portable, and Easily Simulated ESD Protection Networks for Advanced CMOS Technologies
Amr Haggag	Motorola	5 May	Flash MCUs Everywhere: A Look into the Reliability